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PRODUCTS

  

STREAK IMAGING OF HIGH VOLATGE DISCHARGE


·ATOMIC LAYER DEPOSITION
·CCD, EMCCD,ICCD
SPECTROGRAPHS
·CRYOGENIC
PROBE STATIONS
·CRYOGENICS AND MAGNETS
·CW Ti-SAPPHIRE AND DYE LASER
·ELECTRON AND ION
DETECTORS
·FAST FRAME RATE ICCD
·GAS LASERS
·HIGH SPEED
VIDEO CAMERA
·INFRARED SYSTEMS
·LN COOLED CCD
·MAGNETIC AND PHYSICAL PROPERTY MEASUREMENT
·NANOLITHOGRAPHY
·NANOPOSITIONING, MICROSCOPY, CRYOGENICS
·OPO OPTICAL PARAMETRIC OSCILLATOR
·PULSED LASERS
·SAM SCANNING ACOUSTO OPTIC MICROSCOPE
·SPECTRORADIOMETERS
·SPM SCANNING PROBE (LOW TEMPERATURE AND ROOM TEMPERATURE) MICROSCOPE
·SURFACE PLASMON RESONANCE SYSTEMS
·SURFACE SCIENCE
INSTRUMENTS
·THIN FILM DEPOSITION
SYSTEMS
·VSM VIBRATION SAMPLE MAGNETOMETER
·WAVEMETERS
·XRD XRAY
DIFFRACTOMETERS
    

Images taken of high voltage discharge by IPR with a Stanford Computer Optics camera. Exposures were of Microsecond duration and time difference between images also of Microsecond duration, the camera can operate in Picosecond time scales

 
 
 
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