Specialise Instruments

PRODUCTS

INFRARED NON DESTRUCTIVE TESTING

	·	ATOMIC LAYER DEPOSITION
	·	CCD, EMCCD,ICCD SPECTROGRAPHS
	·	CRYOGENICS AND MAGNETS
	·	CW Ti-SAPPHIRE AND DYE LASER
	·	ELECTRON AND ION DETECTORS
	·	FAST FRAME RATE ICCD
	·	HIGH SPEED VIDEO CAMERA
	·	INFRARED SYSTEMS
	·	LN COOLED CCD
	·	MAGNETIC AND PHYSICAL PROPERTY MEASUREMENT
	·	OPO OPTICAL PARAMETRIC OSCILLATOR
	·	PULSED LASERS
	·	SAM SCANNING ACOUSTO OPTIC MICROSCOPE
	·	SPECTRORADIOMETERS
	·	SURFACE SCIENCE INSTRUMENTS
	·	THIN FILM DEPOSITION SYSTEMS
	·	VSM VIBRATION SAMPLE MAGNETOMETER
	·	WAVEMETERS
	·	XRD XRAY DIFFRACTOMETERS

Frequency Modulated Thermal Wave Imaging Technique has been proposed by Indian Institute Of Technology, Delhi for sub surface defect detection in materials. Images shown are Amplitude and Phase Images in mild steel sample obtained using MW camera manufactured by CEDIP Infrared Systems in the 3um to 5um range, using this technique. The phase image clearly shows the defects.