Specialise Instruments

PRODUCTS

NON DESTRUCTIVE EVALUATION BY USING FM THERMOGRAPHY

	·	ATOMIC LAYER DEPOSITION
	·	CCD, EMCCD,ICCD SPECTROGRAPHS
	·	CRYOGENIC PROBE STATIONS
	·	CRYOGENICS AND MAGNETS
	·	CW Ti-SAPPHIRE AND DYE LASER
	·	ELECTRON AND ION DETECTORS
	·	FAST FRAME RATE ICCD
	·	GAS LASERS
	·	HIGH SPEED VIDEO CAMERA
	·	INFRARED SYSTEMS
	·	LN COOLED CCD
	·	MAGNETIC AND PHYSICAL PROPERTY MEASUREMENT
	·	NANOLITHOGRAPHY
	·	NANOPOSITIONING, MICROSCOPY, CRYOGENICS
	·	OPO OPTICAL PARAMETRIC OSCILLATOR
	·	PULSED LASERS
	·	SAM SCANNING ACOUSTO OPTIC MICROSCOPE
	·	SPECTRORADIOMETERS
	·	SPM SCANNING PROBE (LOW TEMPERATURE AND ROOM TEMPERATURE) MICROSCOPE
	·	SURFACE SCIENCE INSTRUMENTS
	·	THIN FILM DEPOSITION SYSTEMS
	·	VSM VIBRATION SAMPLE MAGNETOMETER
	·	WAVEMETERS
	·	XRD XRAY DIFFRACTOMETERS

Experimental arrangement for Digitized Frequency Modulated Thermal Wave Imaging (DFMTWI).
This experiments was carried out at IIT Delhi using a CEDIP IR (Jade MWIR, 3-5@m) system.

Linear frequency modulated signal (chirp) and it’s digitized form, respectively

Phase image at 0.05 Hz, of the 11mm thick mild steel sample with blind holes at various depths, experimentally obtained using DFMTWI. Measurements are made over only one frequency-modulated cycle

Thermal images of the bonded wafer after annealing for two hours at (a) 400 ºC, (b) after annealing at 1100 ºC for ten hours

Phase images of the CFRP sample with Teflon inserts, experimentally obtained using 0.08 Hz. Measurements are made over only one frequency-modulated cycle