Specialise Instruments

PRODUCTS

FMTWI for NDT of CFRP Materials.

	·	ATOMIC LAYER DEPOSITION
	·	CCD, EMCCD,ICCD SPECTROGRAPHS
	·	CRYOGENIC PROBE STATIONS
	·	CRYOGENICS AND MAGNETS
	·	CW Ti-SAPPHIRE AND DYE LASER
	·	ELECTRON AND ION DETECTORS
	·	FAST FRAME RATE ICCD
	·	GAS LASERS
	·	HIGH SPEED VIDEO CAMERA
	·	INFRARED SYSTEMS
	·	LN COOLED CCD
	·	MAGNETIC AND PHYSICAL PROPERTY MEASUREMENT
	·	NANOLITHOGRAPHY
	·	NANOPOSITIONING, MICROSCOPY, CRYOGENICS
	·	OPO OPTICAL PARAMETRIC OSCILLATOR
	·	PULSED LASERS
	·	SAM SCANNING ACOUSTO OPTIC MICROSCOPE
	·	SPECTRORADIOMETERS
	·	SPM SCANNING PROBE (LOW TEMPERATURE AND ROOM TEMPERATURE) MICROSCOPE
	·	SURFACE SCIENCE INSTRUMENTS
	·	THIN FILM DEPOSITION SYSTEMS
	·	VSM VIBRATION SAMPLE MAGNETOMETER
	·	WAVEMETERS
	·	XRD XRAY DIFFRACTOMETERS

Top and cross-sectional views of the experimental CFRP sample (all dimensions are in cm) with defects a,b,c,d of diameters 2, 1.8, 1.2, 0.8 cm, respectively.

Frequency domain profiles of mean removed temperature responses for different excitations. (a) Profiles of FMTWI and PT captured at 20 Hz. (b) Profile of LT captured at 10 Hz acquisition frequency.

Phase images of different excitation schemes at a frequency of 0.02 Hz (location of the defects is as in figure 1 and phase contrast is in radian).

SNRs of the defects.

COURTESY: V S Ghali ¹, R Mulaveesala ¹ and M Takei ²
1 Electronics and Communication Engineering Research Group, PDPM Indian Institute of Information Technology, Design and Manufacturing Jabalpur, Airport Road, Khamaria, Jabalpur, MP-482005, India.
2 Artificial System Science, Graduate School of Chiba University, 1–33 Yayoi Inage, Chiba 263-8522, Japan.