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CORRELATION BASED PULSE COMPRESSION APPROACH FOR NDE OF CFRP SAMPLES


·ATOMIC LAYER DEPOSITION
·CCD, EMCCD,ICCD
SPECTROGRAPHS
·CRYOGENIC
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·SAM SCANNING ACOUSTO OPTIC MICROSCOPE
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·SPM SCANNING PROBE (LOW TEMPERATURE AND ROOM TEMPERATURE) MICROSCOPE
·SURFACE SCIENCE
INSTRUMENTS
·THIN FILM DEPOSITION
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·VSM VIBRATION SAMPLE MAGNETOMETER
·WAVEMETERS
·XRD XRAY
DIFFRACTOMETERS
   

Figure 1(a) Layout of CFRP sample with flat-bottom holes of diameters a = 22 mm, b = 18 mm, c = 12 mm and d = 8 mm at depths of 1.6 mm, 1.74 mm, 1.7 mm and 1.65 mm, respectively, from the surface;

Figure 1(b) Layout of CFRP sample with inclusions of diameters b = 22 mm, c = 18 mm and d = 20 mm and flat-bottom holes of diameters a = 12 mm and e = 8 mm at depths of (from surface) b = 2.63 mm, c = 2.63 mm; d = 2.63 mm, a = 2.25 mm and e = 2.2 mm, respectively.

 

Table 1: Obtained signal-to-noise ratio values for individual defects of a CFRP sample containing flat-bottom holes as defects.

 

Table 2: Obtained signal-to-noise ratio values for individual defects of a CFRP sample containing metallic inclusions and flat-bottom holes as defects.

 

Figure 2(a) Correlation image of flat-bottom holes (Figure1(a)) at group delayed instant of 7.5 s;
Figure 2(b) Phase image obtained at 0.02 Hz for flat-bottom holes (Figure1(a));
Figure 2(c) Correlation image of flat-bottom holes and inclusions (Figure1(b)) at group delayed instants of 17 s;
Figure 2(d) Phase image of flat-bottom holes and inclusions (Figure1(b)) obtained at a frequency of 0.015 Hz.

 

COURTESY: Dr. R Mulaveesala and V S Ghali; Indian Institute of Information Technology Design and Manufacturing, Jabalpur, Madhya Pradesh.

 
 
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